Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction


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Аннотация

The structure of carbon nanopillars grown without catalysis by low-temperature plasmaenhanced-chemical-vapor deposition on a silicon substrate is investigated using the suggested focused ion beam technique for preparing a sample composed of several thin plan-view foils. Studying the prepared sample by electron diffraction and bright-field transmission electron microscopy allows determination of the variation of the two-dimensionally ordered crystallite fraction along the growth direction. It us established that the crystalline phase fraction inside the nanopillars gradually decreases during the growth process. Nearly 90% of the crystalline material is located between the base and the middle of the nanopillars while their upper parts almost entirely consist of amorphous carbon.

Авторлар туралы

R. Volkov

National Research University Moscow Institute of Electronic Technology

Хат алмасуға жауапты Автор.
Email: Neodemeter@gmail.com
Ресей, Moscow, 124498

N. Borgardt

National Research University Moscow Institute of Electronic Technology

Email: Neodemeter@gmail.com
Ресей, Moscow, 124498

D. Gromov

National Research University Moscow Institute of Electronic Technology

Email: Neodemeter@gmail.com
Ресей, Moscow, 124498

S. Dubkov

National Research University Moscow Institute of Electronic Technology

Email: Neodemeter@gmail.com
Ресей, Moscow, 124498

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