Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
- Авторлар: Volkov R.L.1, Borgardt N.I.1, Gromov D.G.1, Dubkov S.V.1
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Мекемелер:
- National Research University Moscow Institute of Electronic Technology
- Шығарылым: Том 12, № 3 (2018)
- Беттер: 473-479
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/195356
- DOI: https://doi.org/10.1134/S1027451018030199
- ID: 195356
Дәйексөз келтіру
Аннотация
The structure of carbon nanopillars grown without catalysis by low-temperature plasmaenhanced-chemical-vapor deposition on a silicon substrate is investigated using the suggested focused ion beam technique for preparing a sample composed of several thin plan-view foils. Studying the prepared sample by electron diffraction and bright-field transmission electron microscopy allows determination of the variation of the two-dimensionally ordered crystallite fraction along the growth direction. It us established that the crystalline phase fraction inside the nanopillars gradually decreases during the growth process. Nearly 90% of the crystalline material is located between the base and the middle of the nanopillars while their upper parts almost entirely consist of amorphous carbon.
Авторлар туралы
R. Volkov
National Research University Moscow Institute of Electronic Technology
Хат алмасуға жауапты Автор.
Email: Neodemeter@gmail.com
Ресей, Moscow, 124498
N. Borgardt
National Research University Moscow Institute of Electronic Technology
Email: Neodemeter@gmail.com
Ресей, Moscow, 124498
D. Gromov
National Research University Moscow Institute of Electronic Technology
Email: Neodemeter@gmail.com
Ресей, Moscow, 124498
S. Dubkov
National Research University Moscow Institute of Electronic Technology
Email: Neodemeter@gmail.com
Ресей, Moscow, 124498
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