Study of the formation and unimolecular fragmentation of Si  n  O  m   +  clusters under ion bombardment

N. Kh. Dzhemilev; S. F. Kovalenko; S. E. Maksimov; O. F. Tukfatullin; Sh. T. Khozhiev

doi:10.1134/S1027451017010074

Study of the formation and unimolecular fragmentation of Si_nO_m⁺ clusters under ion bombardment

Autores: Dzhemilev N.K.¹, Kovalenko S.F.¹, Maksimov S.E.¹, Tukfatullin O.F.¹, Khozhiev S.T.¹
Afiliações:
1. Institute of Ion-Plasma and Laser Technologies
Edição: Volume 11, Nº 3 (2017)
Páginas: 490-495
Seção: Article
URL: https://journals.rcsi.science/1027-4510/article/view/192927
DOI: https://doi.org/10.1134/S1027451017010074
ID: 192927

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Resumo

The dependences of the emission and fragmentation of clusters sputtered by Xe⁺ ions from the surface of Si_nO_m⁺ on the oxygen pressure near the bombarded surface are studied using secondary ion mass spectrometry. It is shown that the process of Si_nO_m⁺ cluster formation under ion bombardment can be described within the framework of the mechanism of combinatorial synthesis by taking into account the mutual reversibility of the reactions of formation and unimolecular decay.