Diagnostics of the Phase Composition of Lead-Zirconate-Titanate Films according to Raman Spectra: Phase Identification
- Авторлар: Beshenkov V.G.1, Znamenskii A.G.1, Irzhak A.V.1, Marchenko V.A.1
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Мекемелер:
- Institute of Microelectronics Technology and High Purity Materials
- Шығарылым: Том 12, № 5 (2018)
- Беттер: 861-865
- Бөлім: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/195940
- DOI: https://doi.org/10.1134/S102745101805004X
- ID: 195940
Дәйексөз келтіру
Аннотация
The problem concerning the diagnostics of the phase composition of lead-zirconate-titanate (PZT) films under conditions of overlapping Raman spectra is solved via applied mathematical statistics. The proposed phase-identification method based on reference spectra is implemented using different Raman-spectrum regions measured on the surface of multiphase PZT films. It is demonstrated that the identification of phases, as well as determination of their concentration, must be performed using the spectral range in which the calculated first principal components of the set of Raman spectra differ to the greatest extent from each other.
Негізгі сөздер
Авторлар туралы
V. Beshenkov
Institute of Microelectronics Technology and High Purity Materials
Хат алмасуға жауапты Автор.
Email: besh@iptm.ru
Ресей, Chernogolovka, Moscow oblast, 142432
A. Znamenskii
Institute of Microelectronics Technology and High Purity Materials
Email: besh@iptm.ru
Ресей, Chernogolovka, Moscow oblast, 142432
A. Irzhak
Institute of Microelectronics Technology and High Purity Materials
Email: besh@iptm.ru
Ресей, Chernogolovka, Moscow oblast, 142432
V. Marchenko
Institute of Microelectronics Technology and High Purity Materials
Email: besh@iptm.ru
Ресей, Chernogolovka, Moscow oblast, 142432
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