Approaches for circle characterization in photolithography


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The problem of determining the center and radius of a substrate in the shape of a circular disc is considered. We propose an original functional having a clear geometric interpretation. Determination of the extremum of this functional reduces to a linear problem. The matrix of the linear system corresponding to the functional is positively defined and well-posed for rather long arcs. Experimental studies show that the proposed method enables the determination of the center of the substrate with an accuracy of 10 μm, based on a small number of measurements of the coordinates of the substrate edge. This accuracy is sufficient for solving a number of applied problems.

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S. Vdovichev

Institute for Physics of Microstructures; Lobachevsky State University; Alekseev State Technical University

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Email: vdovichev@ipmras.ru
俄罗斯联邦, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

N. Vdovicheva

Institute for Physics of Microstructures

Email: vdovichev@ipmras.ru
俄罗斯联邦, Nizhny Novgorod, 603950

I. Shereshevsky

Institute for Physics of Microstructures; Lobachevsky State University

Email: vdovichev@ipmras.ru
俄罗斯联邦, Nizhny Novgorod, 603950; Nizhny Novgorod, 603950

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