Short-Range order of TlIn1–xSnxTe2 thin films

详细

The formation of the short-range order structure of amorphous nanometer-thick TlIn_1–xSn_xTe₂ films (х = 0.02–0.09) obtained via vacuum deposition onto substrates of fresh KCl and KJ chips and celluloid at a temperature below Т = 213 K is studied by high-energy electron diffraction. Both freshly deposited films and films held in vacuum (10^–2 Pa) at room temperature in darkness for several months are studied. The effect of the tin concentration on the interatomic distances, the coordination numbers, and the time of amorphous phase stability of TlIn_1–xSn_xTe₂ films due to a great spread in bond lengths and bond angles is established.