Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra

V. P. Afanas’ev; A. S. Gryazev; D. S. Efremenko; P. S. Kaplya; N. V. Lyapunov

doi:10.1134/S1027451016050037

Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra

Authors: Afanas’ev V.P.¹, Gryazev A.S.¹, Efremenko D.S.¹, Kaplya P.S.¹, Lyapunov N.V.¹
Affiliations:
1. National Research University “Moscow Power Engineering Institute”
Issue: Vol 10, No 5 (2016)
Pages: 906-911
Section: Article
URL: https://journals.rcsi.science/1027-4510/article/view/189615
DOI: https://doi.org/10.1134/S1027451016050037
ID: 189615

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Abstract

The photoelectron spectroscopy model is based on the solution of the radiative transfer equation with inner sources. The exact numerical solutions using BDF method are presented. PES, XAES and EELS spectra are described as series by the number of inelastic scatterings. Differential inverse inelastic mean free path for Be and W are obtained from the experimental data by the fitting procedure.