Email this article First results of the application of scanning XRF analysis with synchrotron-radiation beams from the VEPP-3 to study the spatial distribution of trace elements in samples of stratiform chromite ores
- Authors: Darin A.V.1,2, Veksler I.V.2,3, Rakshun Y.V.4
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Affiliations:
- Sobolev Institute of Geology and Mineralogy
- Perm State National Research University
- Department of Mineralogy and Petrology
- Budker Institute of Nuclear Physics
- Issue: Vol 10, No 1 (2016)
- Pages: 88-91
- Section: Article
- URL: https://journals.rcsi.science/1027-4510/article/view/187890
- DOI: https://doi.org/10.1134/S1027451016010092
- ID: 187890
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Abstract
A sample from chromite horizon UG1 of the platiniferous Bushveld complex (South Africa) is studied by scanning X-ray fluorescence (XRF) microanalysis using synchrotron-radiation beams from the VEPP-3 storage ring. The sample contains plagioclase and chromite layers 3–5 mm in thickness. The experimental study is conducted at excitation energies of 15 and 30 keV; the spot size of the excitation radiation is 0.1 ± 2 mm; and the scanning step is 100 µm. The distribution profiles of more than 20 trace elements over the surface of the sample are obtained.
About the authors
A. V. Darin
Sobolev Institute of Geology and Mineralogy; Perm State National Research University
Author for correspondence.
Email: darin@ngs.ru
Russian Federation, Novosibirsk, 630090; Perm, 614990
I. V. Veksler
Perm State National Research University; Department of Mineralogy and Petrology
Email: darin@ngs.ru
Russian Federation, Perm, 614990; Berlin, 13355
Ya. V. Rakshun
Budker Institute of Nuclear Physics
Email: darin@ngs.ru
Russian Federation, Novosibirsk, 630090
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