On the processes upon the second-photon-stimulated annealing of InAs layers implanted with Be+ ions


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Abstract

The results of the second-photon-stimulated annealing of beryllium-implanted InAs layers are presented. The hole and electron concentrations and the activation energy of second-photon-stimulated annealing are calculated for the characteristic temperature regions using thermopower voltage values measured for the implanted layer. The possible mechanisms of the annealing of radiation-induced defects and the activation of beryllium atoms are discussed.

About the authors

A. V. Artamonov

OAO “Shvabe Photosystems”

Author for correspondence.
Email: art-bass@mail.ru
Russian Federation, Moscow, 117545

V. P. Astakhov

OAO “Shvabe Photosystems”

Email: art-bass@mail.ru
Russian Federation, Moscow, 117545

V. V. Karpov

OAO “Shvabe Photosystems”

Email: art-bass@mail.ru
Russian Federation, Moscow, 117545

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