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Title
Authors
Vol 13, No 5 (2019)
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
Sybina Y.S., Borgardt N.I., Lazarenko P.I., Parsegova V.S., Prikhodko A.S., Sherchenkov A.A.
PDF
(Eng)
Vol 10, No 2 (2016)
Study of multilayer carbon nanotubes subjected to the impact of a nanosecond high-energy ion beam
Bolotov V.V., Knyazev E.V., Sten’kin Y.A., Ivlev K.E.
PDF
(Eng)
Vol 11, No 3 (2017)
Influence of annealing temperature and its atmosphere on the properties of zinc implanted silicon
Privezentsev V.V., Kulikauskas V.S., Zatekin V.V., Shcherbachev K.D., Tabachkova N.Y., Eidelman K.B., Ksenich S.V., Batrakov A.A.
PDF
(Eng)
Vol 12, No 3 (2018)
Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
Volkov R.L., Borgardt N.I., Gromov D.G., Dubkov S.V.
PDF
(Eng)
Vol 11, No 5 (2017)
TEM Study of the microstructure of melt grown FeGe2 single crystals
Bunkin A.Y., Kolosov V.Y., Papushina T.I.
PDF
(Eng)
Vol 13, No 5 (2019)
Tungsten-Containing Phases in Diamond-Like Silicon−Carbon Nanocomposites
Popov A.I., Afanas’ev V.P., Barinov A.D., Bodisko Y.N., Gryazev A.S., Miroshnikova I.N., Presnyakov M.Y., Shupegin M.L.
PDF
(Eng)
Vol 12, No 6 (2018)
Study of the Structure of Polyphthalocyanines by Transmission Electron Microscopy
Sedlovets D.M., Korepanov V.I., Khodos I.I.
PDF
(Eng)
Vol 11, No 1 (2017)
Electron microscopy studies of crystallites in carbon nanopillars grown by low-temperature plasma-enhanced chemical-vapor deposition
Grishina Y.S., Borgardt N.I., Volkov R.L., Gromov D.G., Dubkov S.V.
PDF
(Eng)
Vol 10, No 3 (2016)
High-resolution X-ray diffractometry and transmission electron microscopy as applied to the structural study of InAlAs/InGaAs/InAlAs multilayer transistor nanoheterostructures
Galiev G.B., Klimov E.A., Imamov R.M., Ganin G.V., Pushkarev S.S., Maltsev P.P., Zhigalina O.M., Orekhov A.S., Vasil’ev A.L., Presniakov M.Y., Trunkin I.N.
PDF
(Eng)
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