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Microstructure and Density of Mo Films in Multilayer Mo/Si Mirrors
Vainer Y.A., Garakhin S.A., Polkovnikov V.N., Salashchenko N.N., Svechnikov M.V., Chkhalo N.I., Yunin P.A.
Study of the Influence of Implanted Atoms on the Coefficients of the Sputtering of Silicon and Silicon with a Thin Oxide Film
Tashmukhamedova D.A., Yusupjanova M.B., Tashatov A.K., Umirzakov B.E.
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