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Authors
Vol 12, No 6 (2018)
Depth Profiling Using Reflected Electron Spectroscopy
Afanas’ev V.P., Bodisko Y.N., Gryazev A.S., Kaplya P.S., Fedorovich S.D.
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(Eng)
Vol 11, No 5 (2017)
Influence of elastic-scattering processes on an X-ray photoelectron spectroscopy signal: Effect of the underlying surface
Kaplya P.S., Afanas’ev V.P.
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(Eng)
Vol 11, No 3 (2017)
Algorithm for solving the inverse vibronic problem on the basis of SVL fluorescence spectra
Chernavina M.L., Novoselova A.V., Berezin K.V., Likhter A.M., Gaisina A.R., Stepanovich E.Y., Kartashov M.V., Egorenkova T.A., Antonova E.M., Grechukhina O.N.
PDF
(Eng)
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