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Determination of the Thickness of Thin Films Based on Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis
Sokolov S.A., Milovanov R.A., Sidorov L.N.
Vanadium- and Titanium Dioxide-Based Memristors Fabricated via Pulsed Laser Deposition
Novodvorsky O.A., Parshina L.S., Lotin A.A., Mikhalevsky V.A., Khramova O.D., Cherebylo E.A., Panchenko V.Y.
Microstructure, phase analysis and dielectric response of thin Pb(Zr,Ti)O3 films at the morphotropic phase boundary
Pronin I.P., Pronin V.P., Kanareikin A.G., Dolgintsev D.M., Kaptelov E.Y., Senkevich S.V.
Kinetics of the formation of oxide nanostructures on n-Si in the potentiostatic mode of water anodization
Orlov A.M., Yavtushenko I.O., Makhmud-Akhunov M.Y., Solovyev A.A.
On the Effect of the Crystal Structure in the Sputtering of Two-Component Single-Crystal Structures
Samoilov V.N., Ananieva N.G.
Magnetic Anisotropy in Thin Films of FePt Detected by the Ferromagnetic Resonance Method
Dmitriev A.I., Kulikov A.V., Gilmutdinov I.F., Dremova N.N., Mazitov A.A., Dmitrieva M.S., Alekseev S.I., Myagkov V.G.
Atomic Force Microscopy for Studies of Molecular Layering Products
Sosnov E.A., Kochetkova A.S.
Structural and Dielectric Properties of Organic Ferroelectric 2-Methylbenzimidazole
Balashova E.V., Krichevtsov B.B., Svinarev F.B., Zaitseva N.V., Pankova G.A.
Effect of Co+-ion implantation on the composition and properties of free Si–Cu nanofilm structures
Isakhanov Z.A., Kodirov T., Halmatov A.S., Ruzibaeva M.K., Muhtarov Z.E., Umirzakov B.E.
Specific features of observing magnetization inhomogeneities on the surface of permalloy thin films by means of highly sensitive magnetic-force-microscopy probes
Djuzhev N.A., Kozmin A.M., Chinenkov M.Y.
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