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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

T

Tsukanov, D. A.
Tsvyashenko, A. V.
Tsybalova, L. M.
Tsybin, N. N.
Tsybulsky, L. Yu.
Tuchin, V. V.
Tugaenko, V. U.
Tukfatullin, O. F.
Tukhfatullin, T. A.
Tukhliev, Z. K.
Tukmakov, K. N.
Tuleushev, Yu. Zh.
Tumachev, D. D.
Turaev, N. Yu.
Turaeva, T. L.
Turchenko, V. A.
Turovets, A. I.
Turtin, D. V.
Tutov, E. A.
Tytarenko, V. V.
Tyurin, Yu. I.
Tzkhai, A. A.

U

Udalov, O. G.
Uglov, V. V.
Ukleev, V. A.

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