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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
Home > Search > Browse Author Index

Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

R

Runov, V. V.
Rusakov, V. S.
Rusetskii, A. S.
Russkikh, I. T.
Ruzibaeva, M. K.
Ryabenko, B. V.
Ryabova, M. A.
Ryabtsev, S. A.
Ryazantseva, M. V.
Rybakova, A. V.
Rybakova, L. F.
Rybin, N. B.
Rybina, N. V.
Rybkina, T. V.
Rychkov, G. S.
Rychkov, M. M.
Ryndya, S. M.
Rysbaev, A. S.
Ryzhkova, M. V.

S

Sabbatovsky, K. G.
Sabirov, A. S.
Sabirzyanov, N. A.
Sabitov, D. R.
Sachkov, M. E.
Sadigov, R. M.

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