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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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N

Negodaev, M. A.
Nekrasov, A. N.
Nematov, D. D.
Neov, D.
Neshchimenko, V. V.
Nevedomsky, V. A.
Nigelska, A. I.
Nikiforov, V. N.
Nikiforova, N. N.
Nikitenko, Yu. V.
Nikitenkov, N. N.
Nikitin, A. A.
Nikitin, P. V.
Nikitkov, K. A.
Nikolaev, S. N.
Nikolenko, A. D.
Nikonov, E. G.
Nikulin, V. Ya.
Nishchak, O. Yu.
Niu, Hengli
Nizhelska, A. I.
Nor, P. E.
Noroozi, Z.
Noskov, A. V.
Nosolev, I. K.

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