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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

M

Morgunov, R. B.
Morilova, V. M.
Morkovkin, A. I.
Morozov, A. V.
Morozov, K. V.
Moshkalev, S. A.
Moskalenko, N. I.
Moskvin, E. V.
Moskvina, N. A.
Mostovyi, A. I.
Mosunov, A. V.
Movsisyan, A. E.
Mozgrin, D. V.
Mozhchil, R. N.
Muhametuly, B.
Muhtarov, Z. E.
Mukhamedzhanov, E. Kh.
Mukhgalin, V. V.
Mukhin, A. S.
Mukhin, E. E.
Murashev, M. M.
Murashkina, T. L.
Muravyeva, T. I.
Murzina, T. V.
Muslimov, A. E.

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