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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

K

Kovalskiy, V. A.
Kovivchak, V. S.
Kozhemyakin, G. N.
Kozhevnikov, S. V.
Kozinkin, A. V.
Kozirev, E. N.
Kozlenko, D. P.
Kozlov, A. S.
Kozlov, G. V.
Kozlov, O. V.
Kozlov, V. S.
Kozlova, N. V.
Kozlovskaya, K. A.
Kozlovski, V. V.
Kozlovsky, A. L.
Kozlovsky, V. I.
Kozmin, A. M.
Kraan, W. H.
Krainova, G. S.
Krasheninnikov, S. I.
Krasnenko, T. I.
Krasnoshchekov, S. V.
Krat, S. A.
Krause, S.
Kravchenko, G. V.

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