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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

K

Khaibullin, R. I.
Khaidukova, D. Yu.
Khalaji, A. D.
Khamova, T. V.
Kharchenko, A. A.
Kharlamov, V. F.
Khartov, S. A.
Khasanshin, R. H.
Khastsaev, B. D.
Khatipov, R. S.
Khatipov, S. A.
Khavrov, G. D.
Khaydukov, Yu. N.
Khiem, L. H.
Khlusov, I. A.
Khmelevsky, N. O.
Khodan, A. N.
Khodos, I. I.
Khojiev, Sh. T.
Khokonov, Kh. B.
Kholmurodov, Kh. T.
Kholzakov, A. V.
Khomich, A. A.
Khorkov, K. S.
Khoroshilov, V. V.

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