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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Browse Author Index

A B C D E F G H I J K L M N O P Q R S T U V W X Y Z All

C

Churikov, D. V.
Churilov, A. B.
Churilov, G. N.
Churin, S. A.
Chvalun, S. N.
Clementyev, E. S.
Csik, A.

D

Dabagov, S. B.
Dalkarov, O. D.
Dang, N. T.
Danil’tsev, V. M.
Danilina, E. M.
Danilov, Yu. A.
Dankova, T. E.
Darin, A. V.
Darin, F. A.
Darinskii, A. N.
Davidovskaya, K. S.
Davydovskaya, K. S.
Davygora, A. P.
Dechev, D.
Dedkova, A. A.
Demakov, K. D.
Demchenko, O. V.
Demidov, E. V.

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