Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Kanevsky, V. M.
Issue
Section
Title
File
Vol 12, No 5 (2018)
Article
Electrical Activity of Surface Steps on a Sapphire Crystal Substrate for Epitaxy
Vol 12, No 6 (2018)
Article
Mechanically Activated Mica as an Inert Filler for Heterogeneous Ion-Conducting Composites
Vol 12, No 6 (2018)
Article
Magnetic Properties of Polycrystalline and Amorphous Cobalt- and Nickel-Ferrite Films
Vol 13, No 5 (2019)
Article
Features of the (0001) Supersmooth Surface Structure of Magnetoplumbite-Like LaMgAl
11
O
19
Single Crystals
Vol 13, No 5 (2019)
Article
Electrophysical Properties of Polycrystalline CuIn
0.95
Ga
0.05
Se
2
Films
Vol 13, No 6 (2019)
Article
Structural Features of Pseudomorphic Spinel-Structure Films on
R
-Sapphire Substrates
Vol 13, No 6 (2019)
Article
Features of the Initial Growth Stages of ZnO Films on the Rhombohedral Plane of Sapphire
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