Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Borgardt, N. I.
Issue
Section
Title
File
Vol 11, No 1 (2017)
Article
Electron microscopy studies of crystallites in carbon nanopillars grown by low-temperature plasma-enhanced chemical-vapor deposition
Vol 12, No 3 (2018)
Article
Electron Diffraction Analysis of the Structure of Carbon Nanopillars along the Growth Direction
Vol 12, No 3 (2018)
Article
Simulation of Redeposited Silicon Sputtering under Focused Ion Beam Irradiation
Vol 13, No 5 (2019)
Article
Electron Microscopic Study of the Influence of Annealing on Ge–Sb–Te Thin Films Obtained by Vacuum Thermal Evaporation
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