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Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print) ISSN 1819-7094 (Online)
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
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Keywords Raman spectroscopy X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy atomic-force microscopy channeling ion implantation magnetron sputtering microhardness microstructure neutron diffraction scanning electron microscope scanning electron microscopy silicon simulation small-angle neutron scattering structure surface surface morphology synchrotron radiation thin films
Home > Search > Author Details

Author Details

Lebedev, A. A.

Issue Section Title File
Vol 10, No 4 (2016) Article Effect of recoil atoms on radiation-defect formation in semiconductors under 1–10-MeV proton irradiation
Vol 11, No 5 (2017) Article Radiation resistance of 4H-SiC Schottky diodes under irradiation with 0.9-MeV electrons
Vol 12, No 2 (2018) Article Radiation Resistance of Devices Based on SiC
Vol 13, No 1 (2019) Article Role of the Carbon Sublattice in n-SiС Conductivity Compensation
Vol 13, No 3 (2019) Article Studying the Formation of Single-Layer Graphene on the Surface of SiC
Vol 13, No 6 (2019) Article Dependence of the Kinetics of Radiation-Induced Defect Formation on the Energy Absorbed by Si and SiC when Exposed to Fast Charged Particles
 

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