Study of the Processes of Mesoporous-Silicon Carbonization


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Abstract

Experimental and theoretical studies of the processes of mesoporous-silicon carbonization during the formation of buffer layers for the subsequent epitaxy of 3C-SiC films and related wide-gap semiconductors are performed. Analytical expressions for the effective diffusion factor and diffusion length of carbon atoms in a porous system are obtained. The proposed model takes into account the processes of Knudsen diffusion, coagulation and the overgrowth of pores during the formation of a silicon-carbide layer.

About the authors

A. S. Gusev

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

N. I. Kargin

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

S. M. Ryndya

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

G. K. Safaraliev

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

N. V. Siglovaya

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

A. O. Sultanov

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Author for correspondence.
Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

A. A. Timofeev

National Research Nuclear University “MEPhI” (Moscow Engineering Physics Institute)

Email: smryndya@mephi.ru
Russian Federation, Moscow, 115409

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