Anomalous Coefficient of Ion Reflection from a Crystal under Surface-Channeling Conditions

Abstract

A significant difference in behavior between the coefficients of deuterium-atom reflection upon scattering at crystal and amorphous tungsten is shown. The region where the reflection coefficient is close to 100% is determined by scattering at the first and second crystal layers and depends on the orientation. The effect of ion focusing on second-layer atoms and also various orientation effects are observed. It is shown that, at small grazing angles, the dependence of the reflection coefficient on the energy of transverse particle motion is universal. The dependences on the azimuthal exit angle ϕ exhibit the rainbow scattering effect caused by particle motion in the surface semichannel, while the dependences on the polar angle demonstrate the effect of angular distribution narrowing (ion focusing).