Noise Level Estimation in Phase Images Obtained Using a Shearing Interference Microscope


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A method is described for estimating spatial and temporal noise levels in phase patterns obtained using a shearing interference microscope. Experimental results are presented for a microscope operating with a coherent laser and low-coherence LED light.

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M. Latushko

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

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Email: latushko@vniiofi.ru
俄罗斯联邦, Moscow

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