Email this article Noise Level Estimation in Phase Images Obtained Using a Shearing Interference Microscope
- Authors: Latushko M.I.1
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Affiliations:
- All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
- Issue: Vol 58, No 11 (2016)
- Pages: 1234-1237
- Section: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/245564
- DOI: https://doi.org/10.1007/s11018-016-0876-6
- ID: 245564
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Abstract
A method is described for estimating spatial and temporal noise levels in phase patterns obtained using a shearing interference microscope. Experimental results are presented for a microscope operating with a coherent laser and low-coherence LED light.
About the authors
M. I. Latushko
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Author for correspondence.
Email: latushko@vniiofi.ru
Russian Federation, Moscow
