Noise Level Estimation in Phase Images Obtained Using a Shearing Interference Microscope
- Авторлар: Latushko M.I.1
-
Мекемелер:
- All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
- Шығарылым: Том 58, № 11 (2016)
- Беттер: 1234-1237
- Бөлім: Article
- URL: https://journals.rcsi.science/0543-1972/article/view/245564
- DOI: https://doi.org/10.1007/s11018-016-0876-6
- ID: 245564
Дәйексөз келтіру
Аннотация
A method is described for estimating spatial and temporal noise levels in phase patterns obtained using a shearing interference microscope. Experimental results are presented for a microscope operating with a coherent laser and low-coherence LED light.
Авторлар туралы
M. Latushko
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Хат алмасуға жауапты Автор.
Email: latushko@vniiofi.ru
Ресей, Moscow
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