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Spectral Analysis of the Method for Measuring Phase Shift from an Interferogram


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Abstract

We present the spectral analysis method of measuring phase shift from interferograms based on the differences between them. Limitations of the method are explained and ways of increasing its accuracy are clarified. We examine the effect of the phase shift value and additive noise on the measurement error.

About the authors

G. N. Vishnyakov

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: minaev@vniiofi.ru
Russian Federation, Moscow

G. G. Levin

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: minaev@vniiofi.ru
Russian Federation, Moscow

V. L. Minaev

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Author for correspondence.
Email: minaev@vniiofi.ru
Russian Federation, Moscow

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