Study of the sensitivity of moisture-sensitive structures with UV reduction on the basis of ZnO produced by the sol-gel method
- Авторлар: Permyakov D.1, Belykh M.1, Strogonov A.1
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Мекемелер:
- Voronezh State Technical University
- Шығарылым: Том 87, № 9 (2023)
- Беттер: 1343-1347
- Бөлім: Articles
- URL: https://journals.rcsi.science/0367-6765/article/view/135495
- DOI: https://doi.org/10.31857/S0367676523702368
- EDN: https://elibrary.ru/JIIMCH
- ID: 135495
Дәйексөз келтіру
Аннотация
A structure based on a thin-film nanocrystalline zinc oxide obtained by the sol-gel method on a flexible Kapton substrate has been developed. It has been established that its electrical resistance increases significantly under the influence of moisture contained in the air. When irradiated with ultraviolet radiation, the resistance of the structure decreases by almost two orders of magnitude. After the UV exposure finish, a long-term process of restoration of electrical conductivity is observed, which is described by the fractional-exponential Kohlrausch function.
Авторлар туралы
D. Permyakov
Voronezh State Technical University
Хат алмасуға жауапты Автор.
Email: Dima.P.S@yandex.ru
Russia, 394006, Voronezh
M. Belykh
Voronezh State Technical University
Email: Dima.P.S@yandex.ru
Russia, 394006, Voronezh
A. Strogonov
Voronezh State Technical University
Email: Dima.P.S@yandex.ru
Russia, 394006, Voronezh
Әдебиет тізімі
- Гаськов А.М., Румянцева М.Н. // Неорг. матер. 2000. Т. 36. № 3. С. 369; Gas’kov A.M., Rumyantseva M.N. // Inorg. Mater. 2000. V. 36. No. 3. P. 293.
- Christopher B. // Sci. Reports. 2017. V. 7. No. 6053. P. 1.
- Singh H., Kumar A., Bansod B.S. et al. // RSC Advances. 2018. V. 8. P. 3839.
- Droepenu E.K., Wee B.S., Chin S.F. et al // Biointerface Res. Appl. Chem. 2022. V. 12. No. 3. P. 4261.
- Tsoutsouva M., Panagopoulos C.N., Papadimitriou D. // Mater. Sci. Engin. B. 2011. V. 176. No. 6. P. 480.
- Pranav D., Kartik P., Kamlesh C. // Proc. Technol. 2016. V. 23. P. 328.
- Skowronski L., Ciesielski A., Olszewska A. // Materials (Basel). 2020. V. 13. No. 16. P. 3510.
- Sonima M., Mini V., Arun A. // Nano Express. 2020. V. 1. No. 3. P. 1.
- Zoltan K., Csanad M., Tamas G. // Catalysis Today. 2022. V. 397. P. 16.
- Poornajar M., Marashi P., Fatmehsari D.H. // Ceram. Int. 2016. V. 42. No. 1. P. 173.
- Heitmann U., Westraadt J., O’Connell J. et al. // ACS Appl. Mater. Interfaces. 2022. V. 14. No. 36. P. 41 149.
- Aljameel A.I., Ali M.K.M. // J. Non-Oxide Glass. 2021. V. 13. No. 2. P. 21.
- Kidalov V., Dyadenchuk A., Bacherikov Y. et al // Turk. J. Phys. 2020. V. 44. No. 1. P. 55.
- Wisz G., Virt I., Sagan P. et al // Nanoscale Res. Lett. 2017. V. 12. No. 253. P. 1.
- Белых М.А. // Межвуз. сб. науч. тр. “Твердотельная электроника, микроэлектроника и наноэлектроника”. Воронеж: Изд-во ВГТУ, 2020. С. 37.
- Пермяков Д.С., Белых М.А., Строгонов А.В. // Межвуз. сб. науч. тр. “Микроэлектроника и наноэлектроника: актуальные проблемы”. Воронеж: Изд-во ВГТУ, 2021. С. 4.
- Jian Lin // Nature Commun. 2014. V. 5. No. 5714. P. 2.
- Коренблит И.Я., Шендер Е.Ф. // УФН. 1989. Т. 157. № 2. С. 267; Korenblit I.Ya., Shender E.F. // Sov. Phys. Usp. 1989. V. 32. No. 2. P. 139.
- Hochli U.T., Knorr K., Loidl A. // Adv. Phys. 1990. V. 39. P. 405.