THEORY OF SYSTEMS WITH SMALL BOUNDARY ROUGHNESS IN APPLICATION TO ELECTRON STATES IN QUANTUM CHANNELS, ELECTRO- AND HYDRODYNAMICS

Cover Page

Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

--

About the authors

L. S Braginsky

Rahanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences; Novosibirsk State University

Author for correspondence.
Email: jetp@kapitza.ras.ru
Novosibirsk, Russia

M. V Entin

Rahanov Institute of Semiconductor Physics, Siberian Branch of the Russian Academy of Sciences

Email: jetp@kapitza.ras.ru
Novosibirsk, Russia

References

  1. M. A. Lavrentiev and B. V. Shabat, Methods of Complex Function Theory, Nauka, Moscow (1987).
  2. A. V. Chaplik and M. V. Entin, Energy Spectrum and Electron Mobility in a Thin Film with Nonideal Boundary, JETP 55, 990 (1968.).
  3. R. E. Prange and T. W. Nee, Quantum Spectroscopy of the Low-Field Oscillations in the Surface Impedance, Phys. Rev. 168, 779 (1968).
  4. T. Ando, A. B. Fowler, and F. Stern, Electronic Properties of Two-Dimensional Systems, Rev. Mod. Phys. 54, 437 (1982).
  5. L. S. Braginskii and I. A. Gilinskii, Dokl. Akad. Nauk SSSR 293, 1097 (1987) [Sov. Phys. Dokl. 32, 297 (1987)].
  6. E. L. Feinberg, Propagation of Radionwaves along the Earth's Surface [in Russian], Izd. AN SSSR, Moscow (1961).
  7. P. I. Arseev, Perturbation Theory for the Green's Function of an Electromagnetic Field on a Rough Surface, Zh. Eksp. Teor. Fiz. 93, 464 (1987) [JETP 65, 262 (1987)].
  8. R. Z. Vitlina and A. M. Dykhne, Reflection of Electromagnetic Waves from a Surface with a Low Relief, Zh. Eksp. Teor. Fiz. 99, 1758 (1991) [JETP 72, 983 (1991)].
  9. G. V. Rozhnov, Zh. Eksp. Teor. Fiz. 94, 50 (1988) [Sov. Phys. JETP 67, 240 (1988)].
  10. Y. C. Huang, C. Williams, and H. Smith, Direct Comparison of Cross-Sectional Scanning Capacitance Microscope Dopant Profile and Vertical Secondary Ion-Mass Spectroscopy Profile, J. Vacuum Sci. Technol. B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena 14, 433 (1996).
  11. R. C. Barrett and C. F. Quate, Charge Storage in a Nitride-Oxide-Silicon Medium by Scanning Capacitance Microscopy, J. Appl. Phys. 70 2725 (1991).
  12. N. C. Bruce, A. Garcia-Valenzuela, and D. Kouznetsov, Rough-Surface Capacitor: Approximations of the Capacitance with Elementary Functions, J. Phys. D: Appl. Phys. 32, 2692 (1999).
  13. D. R. Steinhauer, C. P. Vlahacos, S. K. Dutta, F. C. Wellstood, and S. M. Anlage, Surface Resistance Imaging with a Scanning Near-Field Microwave Microscope, Appl. Phys. Lett. 71, 1736 (1997).
  14. C. P. Vlahacos, R. C. Black, S. M. Anlage, A. Amar, and F. C. Wellstood, Nearfield Scanning Microwave Microscope with 100 μm Resolution, Appl. Phys. Lett. 69, 3272 (1996).
  15. Yu Luo, J. B. Pendry, and A. Aubry, Surface Plasmons and Singularities, Nano Lett. 10, 4186 (2010); Yu Luo, A. Aubry, and J. B. Pendry, Electromagnetic Contribution to Surface-Enhanced Raman Scattering from Rough Metal Surfaces: A Transformation Optics Approach, Phys. Rev. B 83, 155422 (2011).
  16. Zeev Nehari, Conformal Mapping, Dover Publications, New York (1982).
  17. https://en.wikipedia.org/wiki/Schwarz-Christoffelmapping

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2025 Russian Academy of Sciences

Согласие на обработку персональных данных

 

Используя сайт https://journals.rcsi.science, я (далее – «Пользователь» или «Субъект персональных данных») даю согласие на обработку персональных данных на этом сайте (текст Согласия) и на обработку персональных данных с помощью сервиса «Яндекс.Метрика» (текст Согласия).