A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates

N. S. Medvedev; Медведев Н. С.; V. D. Kurbatova; Курбатова В. Д.; A. I. Saprykin; Сапрыкин А. И.

doi:10.31857/S004445022303009X

A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates

Authors: Medvedev N.S.¹, Kurbatova V.D.¹^,2, Saprykin A.I.¹^,2
Affiliations:
1. Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences
2. Novosibirsk National State Research University
Issue: Vol 78, No 3 (2023)
Pages: 208-215
Section: ОРИГИНАЛЬНЫЕ СТАТЬИ
URL: https://journals.rcsi.science/0044-4502/article/view/135994
DOI: https://doi.org/10.31857/S004445022303009X
EDN: https://elibrary.ru/FTVMEJ
ID: 135994

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Abstract

A method is proposed for the analysis of trace element concentrates by a thin layer method in combination with inductively coupled plasma mass spectrometry (ICP-MS) and laser ablation (LA). Trace elements concentrates were evaporated on preliminarily prepared areas of a high-purity silicon substrate, after which an LA-ICP-MS analysis was performed. The influence of the LA parameters and the conditions for recording the spectra on the signal of the analytes and the substrate material was studied. The analytical capabilities of the thin layer method in combination with LA-ICP-MS for the analysis of high-purity substances with the preconcentration of trace elements were evaluated. Using an analysis of high-purity nitric acid as an example, it was shown that the limits of detection for analytes in the LA-ICP-MS analysis of trace element concentrates using the thin layer method are in the range from n × 10–11 to n × 10–8 wt %. Thus, the development of combined procedures of analysis, including the preconcentration of trace elements and an analysis of concentrates by LA-ICP-MS, makes it possible to reduce the limits of detection for most analytes by one order of magnitude compared to instrumental ICP-MS analysis.

Keywords

mass spectrometry, inductively coupled plasma, thin layer method, laser ablation, high-purity substances, preconcentration of trace element

References

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