Removal of impurities from zirconium tetrafluoride using metallic zirconium chips
- Authors: Rusakov I.Y.1, Buinovskii A.S.1, Sofronov V.L.1
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Affiliations:
- Seversk Technological Institute
- Issue: Vol 2016, No 11 (2016)
- Pages: 1078-1082
- Section: Article
- URL: https://journals.rcsi.science/0036-0295/article/view/171009
- DOI: https://doi.org/10.1134/S0036029516110124
- ID: 171009
Cite item
Abstract
The sublimation refining of zirconium tetrafluoride (ZTF) from impurities in the presence of metallic zirconium chips is studied. It is shown that, in the presence of metallic zirconium chips, the contents of aluminum, nickel, oxygen, chromium, iron, and silicon impurities in a desublimate decrease and the rate of ZTF sublimation increases. The method of refining is tested under laboratory and pilot conditions and can be recommended for commercial application.
About the authors
I. Yu. Rusakov
Seversk Technological Institute
Author for correspondence.
Email: IYRusakov@mephi.ru
Russian Federation, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
A. S. Buinovskii
Seversk Technological Institute
Email: IYRusakov@mephi.ru
Russian Federation, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
V. L. Sofronov
Seversk Technological Institute
Email: IYRusakov@mephi.ru
Russian Federation, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
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