Removal of impurities from zirconium tetrafluoride using metallic zirconium chips
- 作者: Rusakov I.1, Buinovskii A.1, Sofronov V.1
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隶属关系:
- Seversk Technological Institute
- 期: 卷 2016, 编号 11 (2016)
- 页面: 1078-1082
- 栏目: Article
- URL: https://journals.rcsi.science/0036-0295/article/view/171009
- DOI: https://doi.org/10.1134/S0036029516110124
- ID: 171009
如何引用文章
详细
The sublimation refining of zirconium tetrafluoride (ZTF) from impurities in the presence of metallic zirconium chips is studied. It is shown that, in the presence of metallic zirconium chips, the contents of aluminum, nickel, oxygen, chromium, iron, and silicon impurities in a desublimate decrease and the rate of ZTF sublimation increases. The method of refining is tested under laboratory and pilot conditions and can be recommended for commercial application.
作者简介
I. Rusakov
Seversk Technological Institute
编辑信件的主要联系方式.
Email: IYRusakov@mephi.ru
俄罗斯联邦, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
A. Buinovskii
Seversk Technological Institute
Email: IYRusakov@mephi.ru
俄罗斯联邦, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
V. Sofronov
Seversk Technological Institute
Email: IYRusakov@mephi.ru
俄罗斯联邦, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
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