Removal of impurities from zirconium tetrafluoride using metallic zirconium chips
- Авторлар: Rusakov I.1, Buinovskii A.1, Sofronov V.1
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Мекемелер:
- Seversk Technological Institute
- Шығарылым: Том 2016, № 11 (2016)
- Беттер: 1078-1082
- Бөлім: Article
- URL: https://journals.rcsi.science/0036-0295/article/view/171009
- DOI: https://doi.org/10.1134/S0036029516110124
- ID: 171009
Дәйексөз келтіру
Аннотация
The sublimation refining of zirconium tetrafluoride (ZTF) from impurities in the presence of metallic zirconium chips is studied. It is shown that, in the presence of metallic zirconium chips, the contents of aluminum, nickel, oxygen, chromium, iron, and silicon impurities in a desublimate decrease and the rate of ZTF sublimation increases. The method of refining is tested under laboratory and pilot conditions and can be recommended for commercial application.
Авторлар туралы
I. Rusakov
Seversk Technological Institute
Хат алмасуға жауапты Автор.
Email: IYRusakov@mephi.ru
Ресей, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
A. Buinovskii
Seversk Technological Institute
Email: IYRusakov@mephi.ru
Ресей, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
V. Sofronov
Seversk Technological Institute
Email: IYRusakov@mephi.ru
Ресей, Kommunisticheskii pr. 65, Seversk, Tomsk oblast, 636036
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