Deformation Microstructure of a Copper Single Crystal after Loading by Spherically Converging Shock Waves

Abstract

A layer by layer study of the structure of a 34-mm ball of a copper single crystal after loading by spherically converging shock waves has been performed using transmission electron microscopy. The deformation microstructure along directions \(\left\langle {100} \right\rangle \) and \(\left\langle {110} \right\rangle \) has been studied. It has been revealed that the character of the deformation microstructure substantially depends on both the direction of the shock-wave propagation and on the depth of the layer location in the sample. In the near-surface layers of the ball that are located perpendicular the \(\left\langle {100} \right\rangle \) direction, a well-pronounced cellular dislocation structure is present; in the layers located perpendicular to the \(\left\langle {110} \right\rangle \) direction, no formation of the cellular structure occurs; there is only a high density of homogeneously distributed dislocations. Regardless of the single-crystal orientation, microbands, microtwins, banded structures, and recrystallized grains are detected along with the dislocations. Dislocation vacancy loops are observed in all layers of the ball.