Possibilities of Scanning and Transmission Electron Microscopy for Comparative Analysis of the Microstructure of In-Situ Nanocomposite High-Strength Conductors Based on a Copper Matrix and BCC-Metals


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A method of preparation of samples and quantitative analysis of the structure of in-situ nanocomposite conductors is developed. The microstructure of specimens of in-situ nanocomposites of the Cu – Fe and Cu – V systems with diameter 0.44 – 0.80 mm is analyzed by the methods of transmission and scanning electron microscopyΩ. Both specimens are shown to have a grain-subgrain structure with grain size about 200 nm and precipitates of second phase (Fe/V fibers) with a length of 100 – 400 nm and a thickness of 10 – 80 nm (in cross section).

Sobre autores

S. Nikulin

National University of Science and Technology “MISiS,”

Autor responsável pela correspondência
Email: nikulin@misis.ru
Rússia, Moscow

V. Pantsyrnyi

“NANOÉLECTRO” Scientific Production Association

Email: nikulin@misis.ru
Rússia, Moscow

A. Rozhnov

National University of Science and Technology “MISiS,”

Email: nikulin@misis.ru
Rússia, Moscow

S. Rogachev

National University of Science and Technology “MISiS,”

Email: nikulin@misis.ru
Rússia, Moscow

N. Khlebova

“NANOÉLECTRO” Scientific Production Association

Email: nikulin@misis.ru
Rússia, Moscow

T. Nechaikina

National University of Science and Technology “MISiS,”

Email: nikulin@misis.ru
Rússia, Moscow

V. Khatkevich

National University of Science and Technology “MISiS,”

Email: nikulin@misis.ru
Rússia, Moscow

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