Possibilities of Scanning and Transmission Electron Microscopy for Comparative Analysis of the Microstructure of In-Situ Nanocomposite High-Strength Conductors Based on a Copper Matrix and BCC-Metals

详细

A method of preparation of samples and quantitative analysis of the structure of in-situ nanocomposite conductors is developed. The microstructure of specimens of in-situ nanocomposites of the Cu – Fe and Cu – V systems with diameter 0.44 – 0.80 mm is analyzed by the methods of transmission and scanning electron microscopyΩ. Both specimens are shown to have a grain-subgrain structure with grain size about 200 nm and precipitates of second phase (Fe/V fibers) with a length of 100 – 400 nm and a thickness of 10 – 80 nm (in cross section).