Silicon Film Deposition Using a Gas-Jet Plasma-Chemical Method: Experiment and Gas-Dynamic Simulation
- Авторлар: Sharafutdinov R.G.1, Skovorodko P.A.1, Shchukin V.G.1, Konstantinov V.O.1
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Мекемелер:
- Kutateladze Institute of Thermophysics, Siberian Branch
- Шығарылым: Том 59, № 5 (2018)
- Беттер: 786-793
- Бөлім: Article
- URL: https://journals.rcsi.science/0021-8944/article/view/161289
- DOI: https://doi.org/10.1134/S0021894418050036
- ID: 161289
Дәйексөз келтіру
Аннотация
This paper presents the results of an experimental study, numerical calculation, and analysis within the framework of a gas-dynamic model of silicon film deposition by a gas-jet plasmachemical method. A numerical model of gas mixtures flowing out of an annular nozzle unit and into a reactor is developed, and it allows one to determine a film thickness distribution over the surface of substrates placed in the reactor and satisfactorily describes the experimental data obtained.
Негізгі сөздер
Авторлар туралы
R. Sharafutdinov
Kutateladze Institute of Thermophysics, Siberian Branch
Хат алмасуға жауапты Автор.
Email: molkin@itp.nsc.ru
Ресей, Novosibirsk, 630090
P. Skovorodko
Kutateladze Institute of Thermophysics, Siberian Branch
Email: molkin@itp.nsc.ru
Ресей, Novosibirsk, 630090
V. Shchukin
Kutateladze Institute of Thermophysics, Siberian Branch
Email: molkin@itp.nsc.ru
Ресей, Novosibirsk, 630090
V. Konstantinov
Kutateladze Institute of Thermophysics, Siberian Branch
Email: molkin@itp.nsc.ru
Ресей, Novosibirsk, 630090
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