Silicon Film Deposition Using a Gas-Jet Plasma-Chemical Method: Experiment and Gas-Dynamic Simulation


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This paper presents the results of an experimental study, numerical calculation, and analysis within the framework of a gas-dynamic model of silicon film deposition by a gas-jet plasmachemical method. A numerical model of gas mixtures flowing out of an annular nozzle unit and into a reactor is developed, and it allows one to determine a film thickness distribution over the surface of substrates placed in the reactor and satisfactorily describes the experimental data obtained.

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R. Sharafutdinov

Kutateladze Institute of Thermophysics, Siberian Branch

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Email: molkin@itp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

P. Skovorodko

Kutateladze Institute of Thermophysics, Siberian Branch

Email: molkin@itp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

V. Shchukin

Kutateladze Institute of Thermophysics, Siberian Branch

Email: molkin@itp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

V. Konstantinov

Kutateladze Institute of Thermophysics, Siberian Branch

Email: molkin@itp.nsc.ru
俄罗斯联邦, Novosibirsk, 630090

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