Morphology of pores produced in n-Si {100} by etching in hydrofluoric acid solutions
- 作者: Abramova E.N.1, Khort A.M.1, Syrov Y.V.1, Yakovenko A.G.1, Shvets V.I.1
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隶属关系:
- Institute of Fine Chemical Technologies
- 期: 卷 52, 编号 10 (2016)
- 页面: 979-984
- 栏目: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/157931
- DOI: https://doi.org/10.1134/S0020168516100010
- ID: 157931
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详细
Variations in the contours of pores produced in n-type silicon by electrochemical etching in hydrofluoric acid solutions are interpreted in terms of the mechanism underlying the chemical interaction of the etchant with silicon and the anisotropy of the etchant–silicon system. Mathematical expressions are proposed which describe the contours and limiting radial sizes of pores forming at the very beginning of the etching process (~10–15 s).
作者简介
E. Abramova
Institute of Fine Chemical Technologies
编辑信件的主要联系方式.
Email: anavenko@yandex.ru
俄罗斯联邦, pr. Vernadskogo 86, Moscow, 119571
A. Khort
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
俄罗斯联邦, pr. Vernadskogo 86, Moscow, 119571
Yu. Syrov
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
俄罗斯联邦, pr. Vernadskogo 86, Moscow, 119571
A. Yakovenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
俄罗斯联邦, pr. Vernadskogo 86, Moscow, 119571
V. Shvets
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
俄罗斯联邦, pr. Vernadskogo 86, Moscow, 119571
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