Morphology of pores produced in n-Si {100} by etching in hydrofluoric acid solutions
- Авторлар: Abramova E.N.1, Khort A.M.1, Syrov Y.V.1, Yakovenko A.G.1, Shvets V.I.1
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Мекемелер:
- Institute of Fine Chemical Technologies
- Шығарылым: Том 52, № 10 (2016)
- Беттер: 979-984
- Бөлім: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/157931
- DOI: https://doi.org/10.1134/S0020168516100010
- ID: 157931
Дәйексөз келтіру
Аннотация
Variations in the contours of pores produced in n-type silicon by electrochemical etching in hydrofluoric acid solutions are interpreted in terms of the mechanism underlying the chemical interaction of the etchant with silicon and the anisotropy of the etchant–silicon system. Mathematical expressions are proposed which describe the contours and limiting radial sizes of pores forming at the very beginning of the etching process (~10–15 s).
Негізгі сөздер
Авторлар туралы
E. Abramova
Institute of Fine Chemical Technologies
Хат алмасуға жауапты Автор.
Email: anavenko@yandex.ru
Ресей, pr. Vernadskogo 86, Moscow, 119571
A. Khort
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, pr. Vernadskogo 86, Moscow, 119571
Yu. Syrov
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, pr. Vernadskogo 86, Moscow, 119571
A. Yakovenko
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, pr. Vernadskogo 86, Moscow, 119571
V. Shvets
Institute of Fine Chemical Technologies
Email: anavenko@yandex.ru
Ресей, pr. Vernadskogo 86, Moscow, 119571
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