Effect of Gallium Nitride Film Growth Conditions on Surface Segregation
- Авторлар: Tomashpolsky Y.Y.1, Matyuk V.M.1, Sadovskaya N.V.1
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Мекемелер:
- Karpov Institute of Physical Chemistry (Russian State Scientific Center)
- Шығарылым: Том 54, № 1 (2018)
- Беттер: 26-31
- Бөлім: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/158386
- DOI: https://doi.org/10.1134/S0020168518010168
- ID: 158386
Дәйексөз келтіру
Аннотация
The micro-and nanomorphology and local composition of gallium nitride (GaN) films produced by four different procedures have been studied with the aim of detecting autosegregation phenomena. As a result, a complex autosegregation picture has been demonstrated and discussed. Independent of the growth procedure, all of the gallium nitride films have nonstoichiometric chemical compositions (gallium deficiency), with a degree of nonstoichiometry ranging from ~0.30 to <0.10. We discuss the segregation mechanism, which presumably involves predominant selective diffusion of nitrogen atoms to the surface.
Авторлар туралы
Yu. Tomashpolsky
Karpov Institute of Physical Chemistry (Russian State Scientific Center)
Хат алмасуға жауапты Автор.
Email: tomashpols@yandex.ru
Ресей, per. Obukha 3-1/12, str. 6, Moscow, 105064
V. Matyuk
Karpov Institute of Physical Chemistry (Russian State Scientific Center)
Email: tomashpols@yandex.ru
Ресей, per. Obukha 3-1/12, str. 6, Moscow, 105064
N. Sadovskaya
Karpov Institute of Physical Chemistry (Russian State Scientific Center)
Email: tomashpols@yandex.ru
Ресей, per. Obukha 3-1/12, str. 6, Moscow, 105064
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