Informaçao sobre o Autor
Mikhailov, N. N.
| Edição | Seção | Título | Arquivo |
| Volume 53, Nº 6 (2017) | Nanotechnologies in Optics and Electronics | Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes | |
| Volume 55, Nº 5 (2019) | Physical and Engineering Fundamentals of Microelectronics and Optoelectronics | Express Characterization of Crystalline Perfection of CdxHg1−xTe Structures by Reflection Second Harmonic Generation of Probing Radiation |