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Optoelectronics, Instrumentation and Data Processing
ISSN 8756-6990 (Print) ISSN 1934-7944 (Online)
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
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Keywords Fourier optics Raman scattering computer simulation diffraction efficiency diffractive optical element diffusion digital holography dimensional inspection hyperspectral images image processing image reconstruction laser writing light diffraction mathematical model maximum likelihood method nanomaterials perturbation functions remote sensing scanning speed silicon terahertz radiation
Home > Search > Author Details

Author Details

Neizvestny, I. G.

Issue Section Title File
Vol 52, No 5 (2016) Physical and Engineering Fundamentals of Microelectronics and Optoelectronics Germanium-based metal-insulator-semiconductor transistors as a direction for the further development of CMOS technology
Vol 52, No 5 (2016) Optical Information Technologies Three-spectrum multielement photodetector device
Vol 52, No 5 (2016) Optical Information Technologies Quantum key distribution in single-photon communication system
Vol 52, No 5 (2016) Nanotechnologies in Optics and Electronics Formation of silicon nanocrystals in Si—SiO2—α-Si—SiO2 heterostructures during high-temperature annealing: Experiment and simulation
Vol 52, No 5 (2016) Nanotechnologies in Optics and Electronics Raman studies of phase and atomic compositions of GeSi nanosystems after pulsed annealing
Vol 52, No 5 (2016) Nanotechnologies in Optics and Electronics Monte Carlo simulation of the formation of AIIIBV nanostructures with the use of droplet epitaxy
 

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