Author Details
Azarov, I. A.
| Issue | Section | Title | File |
| Vol 53, No 6 (2017) | Nanotechnologies in Optics and Electronics | Polarization Pyrometry of Layered Semiconductor Structures under Conditions of Low-Temperature Technological Processes | |
| Vol 55, No 1 (2019) | Optical Information Technologies | Ellipsometric Method of Substrate Temperature Measurement in Low-Temperature Processes of Epitaxy of InSb Layers |