Generation of Dynamic Scenes for Testing Infrared Imaging Systems in the Far Infrared Range


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

An important aspect of the development of specialized test rigs for monitoring and estimating information system parameters is the use of devices for test field generation. Simulation rigs based on micromirror modulators capable of real-time generation of dynamic (tunable) images are considered in the present study. For such modulators to be used in the long-wave infrared range of the spectrum, they are upgraded by means of replacement of usual protective glasses by materials that are transparent in the infrared range up to the wavelength of 14 μm. Structural features of the test rigs are considered on the basis of the description of micromirror modulators in the form of echelettes (diffraction gratings with a saw-tooth shape of the grooves). Experimental results are presented. The ability of upgraded modulators to operate within infrared simulation rigs is demonstrated. Such devices offer certain prospects for the development of advanced systems for monitoring and dynamic testing of infrared photodetectors.

About the authors

I. S. Gibin

Institute of Automation and Electrometry, Siberian Branch

Email: nejevenko@iae.nsk.su
Russian Federation, pr. Akademika Koptyuga 1, Novosibirsk, 630090

V. I. Kozik

Institute of Automation and Electrometry, Siberian Branch

Email: nejevenko@iae.nsk.su
Russian Federation, pr. Akademika Koptyuga 1, Novosibirsk, 630090

E. S. Nezhevenko

Institute of Automation and Electrometry, Siberian Branch

Author for correspondence.
Email: nejevenko@iae.nsk.su
Russian Federation, pr. Akademika Koptyuga 1, Novosibirsk, 630090

Supplementary files

Supplementary Files
Action
1. JATS XML

Copyright (c) 2018 Allerton Press, Inc.