Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
- Authors: Trofimov V.N.1, Karmanov V.V.1, Shiryaev A.A.1, Zvonov S.N.2
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Affiliations:
- Perm State Polytechnic University
- OOO Xena
- Issue: Vol 39, No 3 (2019)
- Pages: 276-278
- Section: Article
- URL: https://journals.rcsi.science/1068-798X/article/view/227680
- DOI: https://doi.org/10.3103/S1068798X19030225
- ID: 227680
Cite item
Abstract
The deficiencies of existing standard iron and nickel samples for calibration by means of X-ray diffraction are noted. These standards cannot be used in calibration by magnetic noise recording. A new calibration method based on X-ray diffraction is proposed, using plane samples of the material employed in the manufacture of the actual structures. Theoretical analysis provides the basis for the development of null standards in which a plane sample is deformed by pure flexure or in a cantilever-beam configuration.
About the authors
V. N. Trofimov
Perm State Polytechnic University
Author for correspondence.
Email: tvn_perm@mail.ru
Russian Federation, Perm, 614990
V. V. Karmanov
Perm State Polytechnic University
Author for correspondence.
Email: karmanovs@yandex.ru
Russian Federation, Perm, 614990
A. A. Shiryaev
Perm State Polytechnic University
Author for correspondence.
Email: alex_sh_23-1@mail.ru
Russian Federation, Perm, 614990
S. N. Zvonov
OOO Xena
Author for correspondence.
Email: info@kcena.ru
Russian Federation, Perm, 614000
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