Calibration of X-Ray Diffraction Instruments for Residual-Stress Measurement
- Autores: Trofimov V.N.1, Karmanov V.V.1, Shiryaev A.A.1, Zvonov S.N.2
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Afiliações:
- Perm State Polytechnic University
- OOO Xena
- Edição: Volume 39, Nº 3 (2019)
- Páginas: 276-278
- Seção: Article
- URL: https://journals.rcsi.science/1068-798X/article/view/227680
- DOI: https://doi.org/10.3103/S1068798X19030225
- ID: 227680
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Resumo
The deficiencies of existing standard iron and nickel samples for calibration by means of X-ray diffraction are noted. These standards cannot be used in calibration by magnetic noise recording. A new calibration method based on X-ray diffraction is proposed, using plane samples of the material employed in the manufacture of the actual structures. Theoretical analysis provides the basis for the development of null standards in which a plane sample is deformed by pure flexure or in a cantilever-beam configuration.
Sobre autores
V. Trofimov
Perm State Polytechnic University
Autor responsável pela correspondência
Email: tvn_perm@mail.ru
Rússia, Perm, 614990
V. Karmanov
Perm State Polytechnic University
Autor responsável pela correspondência
Email: karmanovs@yandex.ru
Rússia, Perm, 614990
A. Shiryaev
Perm State Polytechnic University
Autor responsável pela correspondência
Email: alex_sh_23-1@mail.ru
Rússia, Perm, 614990
S. Zvonov
OOO Xena
Autor responsável pela correspondência
Email: info@kcena.ru
Rússia, Perm, 614000
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