Current Transport Mechanism in p-InSb–n-CdTe Heterojunction
- Авторы: Petrosyan S.1,2, Matevosyan L.1,2, Avjyan K.1,2, Nersesyan S.2
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Учреждения:
- Russian–Armenian University
- Institute of Radiophysics and Electronics
- Выпуск: Том 54, № 2 (2019)
- Страницы: 146-152
- Раздел: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228846
- DOI: https://doi.org/10.3103/S1068337219020051
- ID: 228846
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Аннотация
Based on the analysis of the forward current-voltage characteristics of the p-InSb–n-CdTe heterojunction fabricated by a method of pulsed laser deposition, the existence of two charge injection mechanisms was experimentally confirmed. At relatively small external bias voltages (0.03 V < U < 0.15 V), the current is in a satisfactory agreement with the expression I ~ exp(qU/ηkT) with the ideality factor η = 1. Above 0.18 V, the current-voltage characteristic obeys the law I ~ U3/2 followed by an attainment to the linear section (the cut-off voltage of current is 0.47 V). A theoretical model of current transport is given taking into account the peculiarities of the heterojunction band discontinuity, leading to the origination of inversion layer near the interface.
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Об авторах
S. Petrosyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
L. Matevosyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
K. Avjyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Автор, ответственный за переписку.
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
S. Nersesyan
Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Ashtarak