Current Transport Mechanism in p-InSb–n-CdTe Heterojunction
- Авторлар: Petrosyan S.G.1,2, Matevosyan L.M.1,2, Avjyan K.E.1,2, Nersesyan S.R.2
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Мекемелер:
- Russian–Armenian University
- Institute of Radiophysics and Electronics
- Шығарылым: Том 54, № 2 (2019)
- Беттер: 146-152
- Бөлім: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228846
- DOI: https://doi.org/10.3103/S1068337219020051
- ID: 228846
Дәйексөз келтіру
Аннотация
Based on the analysis of the forward current-voltage characteristics of the p-InSb–n-CdTe heterojunction fabricated by a method of pulsed laser deposition, the existence of two charge injection mechanisms was experimentally confirmed. At relatively small external bias voltages (0.03 V < U < 0.15 V), the current is in a satisfactory agreement with the expression I ~ exp(qU/ηkT) with the ideality factor η = 1. Above 0.18 V, the current-voltage characteristic obeys the law I ~ U3/2 followed by an attainment to the linear section (the cut-off voltage of current is 0.47 V). A theoretical model of current transport is given taking into account the peculiarities of the heterojunction band discontinuity, leading to the origination of inversion layer near the interface.
Негізгі сөздер
Авторлар туралы
S. Petrosyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
L. Matevosyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
K. Avjyan
Russian–Armenian University; Institute of Radiophysics and Electronics
Хат алмасуға жауапты Автор.
Email: avjyan@gmail.com
Армения, Yerevan; Ashtarak
S. Nersesyan
Institute of Radiophysics and Electronics
Email: avjyan@gmail.com
Армения, Ashtarak
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