Raman scattering in the submicrometer diamond membrane formed by the lift-off technique
- Авторлар: Tareeva M.V.1, Antonov V.A.2, Popov V.P.2, Palyanov Y.N.3, Tsarik K.A.4, Litvinova A.O.2
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Мекемелер:
- Lebedev Physical Institute
- Rzhanov Institute of Semiconductor Physics
- Sobolev Institute of Geology and Mineralogy
- National Research University of Electronic Technology (MIET)
- Шығарылым: Том 44, № 7 (2017)
- Беттер: 210-214
- Бөлім: Article
- URL: https://journals.rcsi.science/1068-3356/article/view/228411
- DOI: https://doi.org/10.3103/S1068335617070065
- ID: 228411
Дәйексөз келтіру
Аннотация
Spectral characteristics of spontaneous Raman scattering in the submicrometer diamond membrane grown by the hydrogen implantation method are studied in comparison with the single-crystal diamond matrix. A shift in the main line of diamond one-photon excitation (sp3-hybridization) at a frequency of 1324 cm−1 is revealed in the diamond membrane. This fact indicates multiple internal strains (residual compression strains) due to residual defects and is a concequence of the use of the hydrogen implantation method (hydrogen is implanted into diamond to form a sacrificial layer.
Авторлар туралы
M. Tareeva
Lebedev Physical Institute
Хат алмасуға жауапты Автор.
Email: tareeva@sci.lebedev.ru
Ресей, Leninskii pr. 53, Moscow, 119991
V. Antonov
Rzhanov Institute of Semiconductor Physics
Email: tareeva@sci.lebedev.ru
Ресей, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090
V. Popov
Rzhanov Institute of Semiconductor Physics
Email: tareeva@sci.lebedev.ru
Ресей, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090
Yu. Palyanov
Sobolev Institute of Geology and Mineralogy
Email: tareeva@sci.lebedev.ru
Ресей, pr. Akademika Koptyuga 3, Novosibirsk, 630090
K. Tsarik
National Research University of Electronic Technology (MIET)
Email: tareeva@sci.lebedev.ru
Ресей, pl. Shokina 1, Zelenograd, Moscow, 124498
A. Litvinova
Rzhanov Institute of Semiconductor Physics
Email: tareeva@sci.lebedev.ru
Ресей, pr. Akademika Lavrent’eva 13, Novosibirsk, 630090
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