Secondary Electron and Negative-Ion Emission from Metal Surface under the Bombardment by Positive Ions (H+, Cl+, HCl+)

Аннотация

A trap for positive ions (H⁺, Cl⁺, HCl⁺) is created within a time-of-flight mass spectrometer. The yields of secondary electrons and negative ions (HCl⁻, H⁻) formed due to forward and backward scattering of positive ions by steel wire at different kinetic energies (200–750 eV) are measured.